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Wild Band Edges: The Role of Bandgap Grading and Band-Edge Fluctuations in High-Efficiency Chalcogenide Devices

  • National Renewable Energy Laboratory
  • Helmholtz Centre Berlin for Materials and Energy
  • Brandenburg University of Technology
  • University of Toledo
  • China Academy of Engineering Physics

Research output: Contribution to conferencePaperpeer-review

20 Scopus Citations

Abstract

Band-edge effects - including grading, electrostatic fluctuations, bandgap fluctuations, and band tails - affect chalcogenide device efficiency. These effects now require more careful consideration as efficiencies increase beyond 20%. Several aspects of the relationships between band-edge phenomena and device performance for NREL absorbers are examined. For Cu(In, Ga)Se2 devices, recent increases in diffusion length imply changes to the optimum bandgap profile. The origin, impact, and modification of electrostatic and bandgap fluctuations are also discussed. The application of the same principles to devices based on CdTe, kesterites, and emerging absorbers (Cu2SnS3, CuSbS2), considering differences in materials properties, is examined.

Original languageAmerican English
Pages309-314
Number of pages6
DOIs
StatePublished - 18 Nov 2016
Event43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States
Duration: 5 Jun 201610 Jun 2016

Conference

Conference43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Country/TerritoryUnited States
CityPortland
Period5/06/1610/06/16

Bibliographical note

See NREL/CP-5J00-65682 for preprint

NLR Publication Number

  • NREL/CP-5J00-67966

Keywords

  • CAS
  • CdTe
  • CIGS
  • CTS
  • CZTS
  • defect
  • fluctuations
  • grading

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