Wafer and Solar Cell Characterization by GT-PVSCAN6000

Wafer and Solar Cell Characterization by GT-PVSCAN6000

NREL

Research output: Contribution to conference › Paper

Abstract

The PVSCAN is an instrument designed to characterize silicon solar cell materials and devices. It performs a host of measurements that yield spatial maps of dislocation density, grain distribution, reflectance, and photoresponses from near-junction and the bulk of a solar cell.

Original language	American English
Pages	295-299
Number of pages	5
State	Published - 2002
Event	12th Workshop on Crystalline Silicon Solar Cell Materials and Processes - Breckenridge, Colorado Duration: 11 Aug 2002 → 14 Aug 2002

Conference

Conference	12th Workshop on Crystalline Silicon Solar Cell Materials and Processes
City	Breckenridge, Colorado
Period	11/08/02 → 14/08/02

NLR Publication Number

NREL/CP-520-32714

Keywords

12th workshop
crystalline silicon (x-Si) (c-Si)
PV
solar cell materials

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title = "Wafer and Solar Cell Characterization by GT-PVSCAN6000",

abstract = "The PVSCAN is an instrument designed to characterize silicon solar cell materials and devices. It performs a host of measurements that yield spatial maps of dislocation density, grain distribution, reflectance, and photoresponses from near-junction and the bulk of a solar cell.",

keywords = "12th workshop, crystalline silicon (x-Si) (c-Si), PV, solar cell materials",

author = "NREL",

year = "2002",

language = "American English",

pages = "295--299",

note = "12th Workshop on Crystalline Silicon Solar Cell Materials and Processes ; Conference date: 11-08-2002 Through 14-08-2002",

}

TY - CONF

T1 - Wafer and Solar Cell Characterization by GT-PVSCAN6000

AU - NREL, null

PY - 2002

Y1 - 2002

N2 - The PVSCAN is an instrument designed to characterize silicon solar cell materials and devices. It performs a host of measurements that yield spatial maps of dislocation density, grain distribution, reflectance, and photoresponses from near-junction and the bulk of a solar cell.

AB - The PVSCAN is an instrument designed to characterize silicon solar cell materials and devices. It performs a host of measurements that yield spatial maps of dislocation density, grain distribution, reflectance, and photoresponses from near-junction and the bulk of a solar cell.

KW - 12th workshop

KW - crystalline silicon (x-Si) (c-Si)

KW - PV

KW - solar cell materials

M3 - Paper

SP - 295

EP - 299

T2 - 12th Workshop on Crystalline Silicon Solar Cell Materials and Processes

Y2 - 11 August 2002 through 14 August 2002

ER -

Wafer and Solar Cell Characterization by GT-PVSCAN6000

Abstract

Conference

NLR Publication Number

Keywords

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