Unusual Capacitance Emission Transients in CIGS Caused by Large Defect Entropy Changes

David L. Young; Kannan Ramanathan; Richard S. Crandall

Unusual Capacitance Emission Transients in CIGS Caused by Large Defect Entropy Changes

David L. Young
, Kannan Ramanathan
, Richard S. Crandall

Chemistry and Nanoscience

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper › peer-review

2 Scopus Citations

Abstract

Capacitance transient data from bias-pulse experiments on CdS/CIGS solar cells show an unusual behavior at high temperatures. Above 350K a minority carrier trap, with a larger activation energy than a majority carrier trap, emits faster than the lower activation-energy minority trap. A simple enthalpy model for trap emission cannot explain this counterintuitive behavior, but the more complete Gibbs free energy model that includes entropy can explain it. We show that entropy plays a major role in carrier emission from traps in CIGS.

Original language	American English
Pages	259-262
Number of pages	4
State	Published - 2005
Event	31st IEEE Photovoltaic Specialists Conference - 2005 - Lake Buena Vista, FL, United States Duration: 3 Jan 2005 → 7 Jan 2005

Conference

Conference	31st IEEE Photovoltaic Specialists Conference - 2005
Country/Territory	United States
City	Lake Buena Vista, FL
Period	3/01/05 → 7/01/05

Bibliographical note

For preprint version see NREL/CP-520-37359

NLR Publication Number

NREL/CP-520-38867

Cite this

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title = "Unusual Capacitance Emission Transients in CIGS Caused by Large Defect Entropy Changes",

abstract = "Capacitance transient data from bias-pulse experiments on CdS/CIGS solar cells show an unusual behavior at high temperatures. Above 350K a minority carrier trap, with a larger activation energy than a majority carrier trap, emits faster than the lower activation-energy minority trap. A simple enthalpy model for trap emission cannot explain this counterintuitive behavior, but the more complete Gibbs free energy model that includes entropy can explain it. We show that entropy plays a major role in carrier emission from traps in CIGS.",

author = "Young, \{David L.\} and Kannan Ramanathan and Crandall, \{Richard S.\}",

note = "For preprint version see NREL/CP-520-37359; 31st IEEE Photovoltaic Specialists Conference - 2005 ; Conference date: 03-01-2005 Through 07-01-2005",

year = "2005",

language = "American English",

pages = "259--262",

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TY - CONF

T1 - Unusual Capacitance Emission Transients in CIGS Caused by Large Defect Entropy Changes

AU - Young, David L.

AU - Ramanathan, Kannan

AU - Crandall, Richard S.

N1 - For preprint version see NREL/CP-520-37359

PY - 2005

Y1 - 2005

N2 - Capacitance transient data from bias-pulse experiments on CdS/CIGS solar cells show an unusual behavior at high temperatures. Above 350K a minority carrier trap, with a larger activation energy than a majority carrier trap, emits faster than the lower activation-energy minority trap. A simple enthalpy model for trap emission cannot explain this counterintuitive behavior, but the more complete Gibbs free energy model that includes entropy can explain it. We show that entropy plays a major role in carrier emission from traps in CIGS.

AB - Capacitance transient data from bias-pulse experiments on CdS/CIGS solar cells show an unusual behavior at high temperatures. Above 350K a minority carrier trap, with a larger activation energy than a majority carrier trap, emits faster than the lower activation-energy minority trap. A simple enthalpy model for trap emission cannot explain this counterintuitive behavior, but the more complete Gibbs free energy model that includes entropy can explain it. We show that entropy plays a major role in carrier emission from traps in CIGS.

UR - https://www.scopus.com/pages/publications/27944481804

M3 - Paper

AN - SCOPUS:27944481804

SP - 259

EP - 262

T2 - 31st IEEE Photovoltaic Specialists Conference - 2005

Y2 - 3 January 2005 through 7 January 2005

ER -

Unusual Capacitance Emission Transients in CIGS Caused by Large Defect Entropy Changes

Abstract

Conference

Bibliographical note

NLR Publication Number

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Cite this