Time-of-Flight Studies of Minority-Carrier Diffusion in AlxGa1-xAs Homojunctions

R. K. Ahrenkiel; D. J. Dunlavy; H. C. Hamaker; R. T. Green; C. R. Lewis; R. E. Hayes; H. Fardi

doi:10.1063/1.97580

Time-of-Flight Studies of Minority-Carrier Diffusion in AlxGa1-xAs Homojunctions

R. K. Ahrenkiel
, D. J. Dunlavy
, H. C. Hamaker
, R. T. Green
, C. R. Lewis
, R. E. Hayes
, H. Fardi

Materials Science

National Renewable Energy Laboratory
Varian Research Center
University of Colorado Boulder

Research output: Contribution to journal › Article › peer-review

19 Scopus Citations

Abstract

A novel time-of-flight technique has been developed for simultaneously measuring minority-carrier lifetime and diffusivity in homojunctions. A pulsed dye laser produces electron-hole pairs near the front surface of the device. A delay occurs before the onset of photocurrent due to the diffusion transit time of minority carriers to the junction. An analysis of this effect by both a simplified analytical model and a computer simulation gives similar results for the current as a function of time. A fit of the theory to experimental data on Al_0.25Ga_0.75As n/p homojunctions produces minority-carrier lifetime, diffusivity, and diffusion length.

Original language	American English
Pages (from-to)	725-727
Number of pages	3
Journal	Applied Physics Letters
Volume	49
Issue number	12
DOIs	https://doi.org/10.1063/1.97580 https://doi.org/10.1063/1.97580
State	Published - 1986

NLR Publication Number

ACNR/JA-213-7141

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@article{2314b15070684d22a57b4263ab413511,

title = "Time-of-Flight Studies of Minority-Carrier Diffusion in AlxGa1-xAs Homojunctions",

abstract = "A novel time-of-flight technique has been developed for simultaneously measuring minority-carrier lifetime and diffusivity in homojunctions. A pulsed dye laser produces electron-hole pairs near the front surface of the device. A delay occurs before the onset of photocurrent due to the diffusion transit time of minority carriers to the junction. An analysis of this effect by both a simplified analytical model and a computer simulation gives similar results for the current as a function of time. A fit of the theory to experimental data on Al0.25Ga0.75As n/p homojunctions produces minority-carrier lifetime, diffusivity, and diffusion length.",

author = "Ahrenkiel, \{R. K.\} and Dunlavy, \{D. J.\} and Hamaker, \{H. C.\} and Green, \{R. T.\} and Lewis, \{C. R.\} and Hayes, \{R. E.\} and H. Fardi",

year = "1986",

doi = "10.1063/1.97580",

language = "American English",

volume = "49",

pages = "725--727",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

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TY - JOUR

T1 - Time-of-Flight Studies of Minority-Carrier Diffusion in AlxGa1-xAs Homojunctions

AU - Ahrenkiel, R. K.

AU - Dunlavy, D. J.

AU - Hamaker, H. C.

AU - Green, R. T.

AU - Lewis, C. R.

AU - Hayes, R. E.

AU - Fardi, H.

PY - 1986

Y1 - 1986

N2 - A novel time-of-flight technique has been developed for simultaneously measuring minority-carrier lifetime and diffusivity in homojunctions. A pulsed dye laser produces electron-hole pairs near the front surface of the device. A delay occurs before the onset of photocurrent due to the diffusion transit time of minority carriers to the junction. An analysis of this effect by both a simplified analytical model and a computer simulation gives similar results for the current as a function of time. A fit of the theory to experimental data on Al0.25Ga0.75As n/p homojunctions produces minority-carrier lifetime, diffusivity, and diffusion length.

AB - A novel time-of-flight technique has been developed for simultaneously measuring minority-carrier lifetime and diffusivity in homojunctions. A pulsed dye laser produces electron-hole pairs near the front surface of the device. A delay occurs before the onset of photocurrent due to the diffusion transit time of minority carriers to the junction. An analysis of this effect by both a simplified analytical model and a computer simulation gives similar results for the current as a function of time. A fit of the theory to experimental data on Al0.25Ga0.75As n/p homojunctions produces minority-carrier lifetime, diffusivity, and diffusion length.

UR - https://www.scopus.com/pages/publications/0343722761

U2 - 10.1063/1.97580

DO - 10.1063/1.97580

M3 - Article

AN - SCOPUS:0343722761

SN - 0003-6951

VL - 49

SP - 725

EP - 727

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 12

ER -

Time-of-Flight Studies of Minority-Carrier Diffusion in AlxGa1-xAs Homojunctions

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