Abstract
Transition-metal nitrides in ..eta..-carbide-type structures exhibit unusual bonding motifs and proximity to magnetic instabilities. Yet they remain unexplored in thin-film form due to the difficulty of stabilizing nitrogen-poor ternaries among competing phases. Here, we report the thin-film synthesis and phase-stability mapping of the ..eta..-nitride systems Fe-W-N and Fe-Mo-N. Amorphous Fe-M-N (M = W, Mo) combinatorial libraries deposited by reactive cosputtering crystallize upon rapid thermal annealing, enabling systematic identification of synthesis windows as a function of composition and annealing temperature. Using laboratory powder X-ray diffraction and synchrotron grazing incidence wide-angle X-ray scattering, we establish that Fe3Mo3N-based ..eta..-carbide phases form over a substantially broader compositional and thermal range than W-based compositions, where ..eta.. structures are stabilized only when the films are Fe-rich. These trends are rationalized using mixed chemical-potential vs composition phase diagrams that capture the narrow nitrogen chemical-potential stability of ..eta..-nitrides. Magnetic measurements reveal that ferromagnetism is induced in Fe-rich Fe3.54Mo2.46N with a small exchange-bias-like response that is absent in Fe3W3N-based compositions, highlighting the sensitivity of magnetic behavior to modest deviations from stoichiometry. This work establishes practical thin-film synthesis routes for ..eta..-nitride materials and demonstrates how composition can be tuned to access emergent magnetic phenomena in these complex nitrides.
| Original language | American English |
|---|---|
| Pages (from-to) | 6723-6732 |
| Number of pages | 10 |
| Journal | Chemistry of Materials |
| Volume | 38 |
| Issue number | 13 |
| DOIs | |
| State | Published - 2026 |
NLR Publication Number
- NLR/JA-5K00-99190
Keywords
- annealing
- chemical potential
- crystal structure
- Fe3Mo3N
- Fe3W3N
- ferromagnetism
- iron
- magnetism
- molybdenum
- nitride
- phase diagram
- reactive sputtering
- stabilization
- thin film
- tungsten
- XRD
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