The Value Proposition for High Lifetime (p-type) and Thin Silicon Materials in Solar PV Applications

Michael Woodhouse; Peter Hacke; Alan Goodrich

doi:10.1109/PVSC.2012.6318267

The Value Proposition for High Lifetime (p-type) and Thin Silicon Materials in Solar PV Applications

Michael Woodhouse
, Peter Hacke
, Alan Goodrich

Strategic Energy Analysis Center

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper

Original language	American English
Pages	003238-003241
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.2012.6318267
State	Published - 2012
Event	38th IEEE Photovoltaic Specialists Conference (PVSC '12) - Austin, Texas Duration: 3 Jun 2012 → 8 Jun 2012

Conference

Conference	38th IEEE Photovoltaic Specialists Conference (PVSC '12)
City	Austin, Texas
Period	3/06/12 → 8/06/12

Bibliographical note

See CP-6A20-55477 for preprint

NLR Publication Number

NREL/CP-6A20-56932

Access to Document

10.1109/PVSC.2012.6318267

Cite this

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title = "The Value Proposition for High Lifetime (p-type) and Thin Silicon Materials in Solar PV Applications",

author = "Michael Woodhouse and Peter Hacke and Alan Goodrich",

note = "See CP-6A20-55477 for preprint; 38th IEEE Photovoltaic Specialists Conference (PVSC \'12) ; Conference date: 03-06-2012 Through 08-06-2012",

year = "2012",

doi = "10.1109/PVSC.2012.6318267",

language = "American English",

pages = "003238--003241",

}

TY - CONF

T1 - The Value Proposition for High Lifetime (p-type) and Thin Silicon Materials in Solar PV Applications

AU - Woodhouse, Michael

AU - Hacke, Peter

AU - Goodrich, Alan

N1 - See CP-6A20-55477 for preprint

PY - 2012

Y1 - 2012

UR - https://www.scopus.com/pages/publications/84869479829

U2 - 10.1109/PVSC.2012.6318267

DO - 10.1109/PVSC.2012.6318267

M3 - Paper

SP - 3238

EP - 3241

T2 - 38th IEEE Photovoltaic Specialists Conference (PVSC '12)

Y2 - 3 June 2012 through 8 June 2012

ER -

The Value Proposition for High Lifetime (p-type) and Thin Silicon Materials in Solar PV Applications

Conference

Bibliographical note

NLR Publication Number

Access to Document

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Fingerprint

Cite this