TEM Sample Preparation and Analysis of Single-Crystalline Si Spheres

TEM Sample Preparation and Analysis of Single-Crystalline Si Spheres

NREL

Research output: Contribution to conference › Paper

Original language	American English
Pages	876-877
Number of pages	2
State	Published - 1994
Event	52nd Annual Meeting of the Microscopy Society of America and the 29th Annual Meeting of the Microbeam Analysis Society Joint Conference - New Orleans, Louisiana Duration: 31 Jul 1994 → 5 Aug 1994

Conference

Conference	52nd Annual Meeting of the Microscopy Society of America and the 29th Annual Meeting of the Microbeam Analysis Society Joint Conference
City	New Orleans, Louisiana
Period	31/07/94 → 5/08/94

NLR Publication Number

NREL/CP-412-6410

Cite this

@conference{30c4a9121e93470e8644072ca8dc39ca,

title = "TEM Sample Preparation and Analysis of Single-Crystalline Si Spheres",

author = "NREL",

year = "1994",

language = "American English",

pages = "876--877",

note = "52nd Annual Meeting of the Microscopy Society of America and the 29th Annual Meeting of the Microbeam Analysis Society Joint Conference ; Conference date: 31-07-1994 Through 05-08-1994",

}