Study of Defect Levels in CdTe Using Thermoelectric Effect Spectroscopy

Research output: Contribution to journal › Article › peer-review

Original language	American English
Pages (from-to)	1333-1340
Number of pages	8
Journal	Journal of Electronic Materials
Volume	35
Issue number	6
DOIs	https://doi.org/10.1007/s11664-006-0264-0
State	Published - 2006

NLR Publication Number

@article{5c8d27cdb7f5454e8fbde132b4221e78,

title = "Study of Defect Levels in CdTe Using Thermoelectric Effect Spectroscopy",

author = "Suhuai Wei",

year = "2006",

doi = "10.1007/s11664-006-0264-0",

language = "American English",

volume = "35",

pages = "1333--1340",

journal = "Journal of Electronic Materials",

issn = "0361-5235",

publisher = "Springer New York",

number = "6",

}