Abstract
This report describes basic issues behind CdTe/CdS cell performance and stability, such as the nature and electronic properties of impurities and defects that control the majority carrier concentration, mechanisms of dopant compensation, recombination processes, their nature and properties, migration and transformation of defects under various processing, stress, and operating conditions. Webelieve that a better basic understanding of the specific influence of grain boundaries, especially for fine-grain materials such as those making up CdTe-based cells, is now one of the most important issues we must address. We need to clarify the role of grain boundaries in forming the film electronic properties, as well as those of the p-n junction.
| Original language | American English |
|---|---|
| Publisher | National Laboratory of the Rockies (NLR) |
| Number of pages | 132 |
| State | Published - 2007 |
Bibliographical note
Work performed by Colorado School of Mines, Golden, ColoradoNLR Publication Number
- NREL/SR-520-41129
Keywords
- admittance spectroscopy
- capacitance transients
- charge injection spectroscopy
- chemical bath deposition (CBD)
- deep electronic states
- electrodeposition
- electroluminescence
- gas-jet system
- gas-transport deposition
- grain boundaries (GBS)
- optimization
- photoluminescence
- post-deposition annealing
- scanning tunneling microscopy (STM)
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