Structure and Electronic Studies of Defects in Amorphous Silicon; Final Report; Period Covering May 1981 - April 1982

    Research output: NLR › Subcontract Report

    Original languageAmerican English
    Number of pages31
    StatePublished - 1982

    Bibliographical note

    Work performed by Xerox Palo Alto Research Center, Palo Alto, California

    NLR Publication Number

    • SERI/TR-9079-1-T7

    Other Report Number

    • SERI/TR-9079-1-T7

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