Structural Study of CIGS2 Thin Film Absorbers using EBSD Technique

Research output: Contribution to conference › Paper

Original language	American English
Pages	163-167
Number of pages	5
DOIs	https://doi.org/10.1557/opl.2011.828
State	Published - 2011
Event	2011 Materials Research Society Symposium - San Francisco, California Duration: 25 Apr 2011 → 29 Apr 2011

Conference	2011 Materials Research Society Symposium
City	San Francisco, California
Period	25/04/11 → 29/04/11

NLR Publication Number

@conference{232d314ec55e42029fddf7a6f892cbbf,

title = "Structural Study of CIGS2 Thin Film Absorbers using EBSD Technique",

keywords = "electron backscatter diffraction, thin films",

author = "Helio Moutinho",

year = "2011",

doi = "10.1557/opl.2011.828",

language = "American English",

pages = "163--167",

note = "2011 Materials Research Society Symposium ; Conference date: 25-04-2011 Through 29-04-2011",

}