Structural and Electronic Studies of Defects in Amorphous Silicon

Structural and Electronic Studies of Defects in Amorphous Silicon

NREL

Research output: Contribution to conference › Paper

Original language	American English
Pages	213-222
Number of pages	10
State	Published - 1987
Event	1987 Amorphous Silicon Subcontractors' Review Meeting - Palo Alto, California Duration: 26 Jan 1987 → 27 Jan 1987

Conference

Conference	1987 Amorphous Silicon Subcontractors' Review Meeting
City	Palo Alto, California
Period	26/01/87 → 27/01/87

Bibliographical note

Work performed by Xerox Palo Alto Research Center, Palo Alto, California

NLR Publication Number

ACNR/CP-8751

Cite this

@conference{61aaa9980ea14856b3f1e5761fc8d377,

title = "Structural and Electronic Studies of Defects in Amorphous Silicon",

author = "NREL",

note = "Work performed by Xerox Palo Alto Research Center, Palo Alto, California; 1987 Amorphous Silicon Subcontractors\' Review Meeting ; Conference date: 26-01-1987 Through 27-01-1987",

year = "1987",

language = "American English",

pages = "213--222",

}