Step-Stress Accelerated Lifetime Testing for Photovoltaic Devices and Cells

Research output: Contribution to conference › Paper

Original language	American English
Number of pages	5
DOIs	https://doi.org/10.1109/PVSC.2010.5742825
State	Published - 2010
Event	35th IEEE Photovoltaic Specialists Conference (PVSC '10) - Honolulu, Hawaii Duration: 20 Jun 2010 → 25 Jun 2010

Conference	35th IEEE Photovoltaic Specialists Conference (PVSC '10)
City	Honolulu, Hawaii
Period	20/06/10 → 25/06/10

NLR Publication Number

@conference{fa376fc297984d1dafeabec72e730aea,

title = "Step-Stress Accelerated Lifetime Testing for Photovoltaic Devices and Cells",

keywords = "accelerated lifetime testing, lifecycle costs, solar cells",

author = "Changwon Suh and Jinsuk Lee",

year = "2010",

doi = "10.1109/PVSC.2010.5742825",

language = "American English",

note = "35th IEEE Photovoltaic Specialists Conference (PVSC \'10) ; Conference date: 20-06-2010 Through 25-06-2010",

}

TY - CONF

T1 - Step-Stress Accelerated Lifetime Testing for Photovoltaic Devices and Cells

AU - Suh, Changwon

AU - Lee, Jinsuk

PY - 2010

Y1 - 2010

KW - accelerated lifetime testing

KW - lifecycle costs

KW - solar cells

U2 - 10.1109/PVSC.2010.5742825

DO - 10.1109/PVSC.2010.5742825

M3 - Paper

T2 - 35th IEEE Photovoltaic Specialists Conference (PVSC '10)

Y2 - 20 June 2010 through 25 June 2010

ER -