Abstract
This paper evaluates the individual module and array performance of Siemens Solar Industries' copper indium diselenide (CIS) polycrystalline thin-film technology. This is accomplished by studying module and array performance over time. Preliminary temperature coefficients for maximum power, maximum-power voltage, maximum-power current, open-circuit current, and fill factor are determined at boththe module and array level. These coefficients are used to correct module/array performance to 25 deg. C to evaluate stability. We show that CIS exhibits a strong inverse correlation between array power and back-of-module temperature. This is due mainly to the narrow bandgap of the CIS materials, which results in a strong inverse correlation between voltage and temperature. We also show that thetemperature-corrected module and array performance has been relatively stable over the evaluation interval (~2 years).
| Original language | American English |
|---|---|
| Pages | 965-968 |
| Number of pages | 4 |
| DOIs | |
| State | Published - 1996 |
| Event | Twenty Fifth IEEE Photovoltaic Specialists Conference - Washington, D.C. Duration: 13 May 1996 → 17 May 1996 |
Conference
| Conference | Twenty Fifth IEEE Photovoltaic Specialists Conference |
|---|---|
| City | Washington, D.C. |
| Period | 13/05/96 → 17/05/96 |
NLR Publication Number
- NREL/CP-22431
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