Screening of Silicon Wafers used in Photovoltaics

Research output: Patent

Abstract

A method for screening silicon-based wafers used in the photovoltaic industry is provided herewith.

@misc{62a73224b291483d939029135e91f0ea,

title = "Screening of Silicon Wafers used in Photovoltaics",

abstract = "A method for screening silicon-based wafers used in the photovoltaic industry is provided herewith.",

author = "NREL",

year = "2011",

language = "American English",

publisher = "National Laboratory of the Rockies (NLR)",

address = "United States",

type = "Patent",

note = "8,006,566 B2",

}

TY - PAT

T1 - Screening of Silicon Wafers used in Photovoltaics

AU - NREL, null

PY - 2011

Y1 - 2011

N2 - A method for screening silicon-based wafers used in the photovoltaic industry is provided herewith.

AB - A method for screening silicon-based wafers used in the photovoltaic industry is provided herewith.

M3 - Patent

M1 - 8,006,566 B2

PB - National Laboratory of the Rockies (NLR)

ER -