Scanning Tunneling Microscopy Studies of the Surfaces of a-Si:H and a-SiGe:H, Annual Subcontract Report, 1 December 1989 - 31 January 1991

Research output: NLR › Subcontract Report

Original language	American English
Publisher	National Laboratory of the Rockies (NLR)
Number of pages	26
DOIs	https://doi.org/10.2172/5681404
State	Published - 1991

Work performed by the National Institute of Standards and Technology, Boulder, Colorado

NLR Publication Number

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title = "Scanning Tunneling Microscopy Studies of the Surfaces of a-Si:H and a-SiGe:H, Annual Subcontract Report, 1 December 1989 - 31 January 1991",

keywords = "amorphous state, film growth, microscopes, photovoltaics, silicon, solar cells",

author = "NREL",

note = "Work performed by the National Institute of Standards and Technology, Boulder, Colorado",

year = "1991",

doi = "10.2172/5681404",

language = "American English",

publisher = "National Laboratory of the Rockies (NLR)",

address = "United States",

type = "Other",

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T1 - Scanning Tunneling Microscopy Studies of the Surfaces of a-Si:H and a-SiGe:H, Annual Subcontract Report, 1 December 1989 - 31 January 1991

AU - NREL, null

N1 - Work performed by the National Institute of Standards and Technology, Boulder, Colorado

PY - 1991

Y1 - 1991

KW - amorphous state

KW - film growth

KW - microscopes

KW - photovoltaics

KW - silicon

KW - solar cells

U2 - 10.2172/5681404

DO - 10.2172/5681404

M3 - Subcontract Report

PB - National Laboratory of the Rockies (NLR)

ER -