Skip to main navigation Skip to search Skip to main content

Research on the Structural and Electronic Properties of Defects in Amorphous Silicon, Annual Subcontract Report, July 1988 - August 1989

    Research output: NLRSubcontract Report

    Original languageAmerican English
    PublisherNational Laboratory of the Rockies (NLR)
    Number of pages53
    StatePublished - 1990

    Bibliographical note

    Work performed by Xerox Palo Alto Research Center, Palo Alto, California

    NLR Publication Number

    • SERI/SR-211-3830

    Cite this