Quantitative EDS and WDS X-ray Microanalysis of Semiconductor Materials: Principles and Comparisons

Research output: Contribution to journal › Article

Original language	American English
Pages (from-to)	471-479
Number of pages	9
Journal	Journal of Electron Microscopy Technique
Volume	2
Issue number	5
DOIs	https://doi.org/10.1002/jemt.1060020509
State	Published - 1985

NLR Publication Number

@article{b8f2ee882e6046f8a4fd0a74d8f7ed3d,

title = "Quantitative EDS and WDS X-ray Microanalysis of Semiconductor Materials: Principles and Comparisons",

author = "NREL",

year = "1985",

doi = "10.1002/jemt.1060020509",

language = "American English",

volume = "2",

pages = "471--479",

journal = "Journal of Electron Microscopy Technique",

issn = "0741-0581",

publisher = "John Wiley \& Sons Inc.",

number = "5",

}