Skip to main navigation Skip to search Skip to main content

Physics and Chemistry of Hot-Wire Chemical Vapor Deposition from Silane: Measuring and Modeling the Silicon Epitaxy Deposition Rate: Article No. 054906

  • Ina Martin
  • , Charles Teplin
  • , James Doyle
    • National Renewable Energy Laboratory
    • University of Minnesota

    Research output: Contribution to journalArticlepeer-review

    Original languageAmerican English
    Number of pages9
    JournalJournal of Applied Physics
    Volume107
    Issue number5
    DOIs
    StatePublished - 2010

    NLR Publication Number

    • NREL/JA-520-47774

    Keywords

    • deposition rate
    • film
    • vapor

    Fingerprint

    Dive into the research topics of 'Physics and Chemistry of Hot-Wire Chemical Vapor Deposition from Silane: Measuring and Modeling the Silicon Epitaxy Deposition Rate: Article No. 054906'. Together they form a unique fingerprint.

    Cite this