Physical Characterization of Thin-Film Solar Cells

Ken Durose; Sally E. Asher; Wolfram Jaegermann; Dean Levi; Brian E. McCandless; Wyatt Metzger; Helio Moutinho; P. D. Paulson; Craig L. Perkins; James R. Sites; Glenn Teeter; Mathias Terheggen

doi:10.1002/pip.542

Physical Characterization of Thin-Film Solar Cells

Ken Durose
, Sally E. Asher
, Wolfram Jaegermann
, Dean Levi
, Brian E. McCandless
, Wyatt Metzger
, Helio Moutinho
, P. D. Paulson
, Craig L. Perkins
, James R. Sites
, Glenn Teeter
, Mathias Terheggen

Materials Science

Durham University
National Renewable Energy Laboratory
Technische Universität Darmstadt
University of Delaware
Colorado State University
Swiss Federal Institute of Technology Zurich

Research output: Contribution to journal › Article › peer-review

83 Scopus Citations

Abstract

The principal techniques used in the physical characterization of thin-film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X-ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), photoluminescence and time-resolved photoluminescence (TRPL), electron-beam-induced current (EBIC) and light-beam-induced current (LBIC). For each method the particular applicability to thin-film solar cells is highlighted. Examples of the use of each are given, these being drawn from the chalcopyrite, CdTe, Si and III-V materials systems.

Original language	American English
Pages (from-to)	177-217
Number of pages	41
Journal	Progress in Photovoltaics: Research and Applications
Volume	12
Issue number	2-3
DOIs	https://doi.org/10.1002/pip.542 https://doi.org/10.1002/pip.542
State	Published - 2004

NLR Publication Number

NREL/JA-520-36458

Keywords

Characterization
Chemical analysis
Microstructure
Optical properties
Spatially resolved functionality
Thin-film solar cell

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title = "Physical Characterization of Thin-Film Solar Cells",

abstract = "The principal techniques used in the physical characterization of thin-film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X-ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), photoluminescence and time-resolved photoluminescence (TRPL), electron-beam-induced current (EBIC) and light-beam-induced current (LBIC). For each method the particular applicability to thin-film solar cells is highlighted. Examples of the use of each are given, these being drawn from the chalcopyrite, CdTe, Si and III-V materials systems.",

keywords = "Characterization, Chemical analysis, Microstructure, Optical properties, Spatially resolved functionality, Thin-film solar cell",

author = "Ken Durose and Asher, \{Sally E.\} and Wolfram Jaegermann and Dean Levi and McCandless, \{Brian E.\} and Wyatt Metzger and Helio Moutinho and Paulson, \{P. D.\} and Perkins, \{Craig L.\} and Sites, \{James R.\} and Glenn Teeter and Mathias Terheggen",

year = "2004",

doi = "10.1002/pip.542",

language = "American English",

volume = "12",

pages = "177--217",

journal = "Progress in Photovoltaics: Research and Applications",

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publisher = "John Wiley and Sons Ltd",

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TY - JOUR

T1 - Physical Characterization of Thin-Film Solar Cells

AU - Durose, Ken

AU - Asher, Sally E.

AU - Jaegermann, Wolfram

AU - Levi, Dean

AU - McCandless, Brian E.

AU - Metzger, Wyatt

AU - Moutinho, Helio

AU - Paulson, P. D.

AU - Perkins, Craig L.

AU - Sites, James R.

AU - Teeter, Glenn

AU - Terheggen, Mathias

PY - 2004

Y1 - 2004

N2 - The principal techniques used in the physical characterization of thin-film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X-ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), photoluminescence and time-resolved photoluminescence (TRPL), electron-beam-induced current (EBIC) and light-beam-induced current (LBIC). For each method the particular applicability to thin-film solar cells is highlighted. Examples of the use of each are given, these being drawn from the chalcopyrite, CdTe, Si and III-V materials systems.

AB - The principal techniques used in the physical characterization of thin-film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X-ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), photoluminescence and time-resolved photoluminescence (TRPL), electron-beam-induced current (EBIC) and light-beam-induced current (LBIC). For each method the particular applicability to thin-film solar cells is highlighted. Examples of the use of each are given, these being drawn from the chalcopyrite, CdTe, Si and III-V materials systems.

KW - Characterization

KW - Chemical analysis

KW - Microstructure

KW - Optical properties

KW - Spatially resolved functionality

KW - Thin-film solar cell

UR - https://www.scopus.com/pages/publications/1842628556

U2 - 10.1002/pip.542

DO - 10.1002/pip.542

M3 - Article

AN - SCOPUS:1842628556

SN - 1062-7995

VL - 12

SP - 177

EP - 217

JO - Progress in Photovoltaics: Research and Applications

JF - Progress in Photovoltaics: Research and Applications

IS - 2-3

ER -

Physical Characterization of Thin-Film Solar Cells

Abstract

NLR Publication Number

Keywords

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