Photo-Induced Degradation and Stability in Semiconductor Devices

Photo-Induced Degradation and Stability in Semiconductor Devices

NREL

Research output: Contribution to conference › Paper

Original language	American English
Pages	185-192
Number of pages	8
State	Published - 1987
Event	International Conference on Stability of Amorphous Silicon Alloy Materials and Devices - Palo Alto, California Duration: 28 Jan 1987 → 30 Jan 1987

Conference

Conference	International Conference on Stability of Amorphous Silicon Alloy Materials and Devices
City	Palo Alto, California
Period	28/01/87 → 30/01/87

Bibliographical note

Work performed by Center for Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts

NLR Publication Number

ACNR/CP-8725

Cite this

@conference{38c20e36f74e483ba24f42611b76eee7,

title = "Photo-Induced Degradation and Stability in Semiconductor Devices",

author = "NREL",

note = "Work performed by Center for Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts; International Conference on Stability of Amorphous Silicon Alloy Materials and Devices ; Conference date: 28-01-1987 Through 30-01-1987",

year = "1987",

language = "American English",

pages = "185--192",

}

TY - CONF

T1 - Photo-Induced Degradation and Stability in Semiconductor Devices

AU - NREL, null

N1 - Work performed by Center for Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts

PY - 1987

Y1 - 1987

M3 - Paper

SP - 185

EP - 192

T2 - International Conference on Stability of Amorphous Silicon Alloy Materials and Devices

Y2 - 28 January 1987 through 30 January 1987

ER -