Abstract
Enargite Cu3AsS4 is a promising absorber for thin-film solar cells but little is known about its optoelectronic properties. Here, we present photoluminescence (PL) spectroscopy, time-resolved terahertz spectroscopy (TRTS), timeresolved photoluminescence (TRPL) spectroscopy, and cyclic voltammetry (CV) measurements of enargite thin films. The results indicate promising defect characteristics with minority carrier lifetimes on the order of ns, and band alignments suggest that buffer layers besides CdS must be developed to achieve high efficiency Cu3AsS4 solar cells.
| Original language | American English |
|---|---|
| Pages | 2310-2314 |
| Number of pages | 5 |
| DOIs | |
| State | Published - Jun 2019 |
| Event | 46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States Duration: 16 Jun 2019 → 21 Jun 2019 |
Conference
| Conference | 46th IEEE Photovoltaic Specialists Conference, PVSC 2019 |
|---|---|
| Country/Territory | United States |
| City | Chicago |
| Period | 16/06/19 → 21/06/19 |
Bibliographical note
Publisher Copyright:© 2019 IEEE.
NLR Publication Number
- NREL/CP-5K00-76322
Keywords
- copper compounds
- nanocrystals
- photovoltaic cells
- semiconductor materials
- thin film devices
Fingerprint
Dive into the research topics of 'Optoelectronic Characterization of Emerging Solar Absorber Cu3AsS4'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver