@misc{8cc6fadcbe834875a005ab189903096f,
title = "Optical Modeling of Polysilicon: TOPCon PV",
abstract = "Determine how film thickness changes with different deposition methods. Analyze relationship between film thickness and optical constants. The deposition rate of intrinsic polysilicon is higher during initial deposition then begins to slow down as deposition time increases. Longer depositions of polysilicon are more crystalline in structure than shorter depositions. N-type doping of polysilicon is more crystalline in structure than p-type doping, despite similar film thicknesses.",
keywords = "Bruggeman effective media approximation, EMA, general oscillator, optical model, photovoltaic, poly-Si, polysilicon, PV, TOPCon, tunnel oxide passivated contact",
author = "Arihana Roos and Eric Rada and William Nemeth and David Young and Jason Stoke",
year = "2024",
language = "American English",
series = "Presented at the Murdock College Science Research Conference, 8-9 November 2024, Vancouver, Washington",
publisher = "National Laboratory of the Rockies (NLR)",
address = "United States",
type = "Other",
}