Abstract
We report direct observation of the existence of buried thin wurtzite CdTe layers in nominally pure zinc-blende CdTe thin films using high-resolution transmission electron microscopy. The formation of the buried wurtzite layers is a result of the formation of high density of planar defects in the zinc-blende films - the wurtzite layers are formed by closely spaced lamellar twins. First-principles calculations reveal that the presence of the buried wurtzite layers may be responsible for the poor electrical properties of the polycrystalline zinc-blende CdTe films.
| Original language | American English |
|---|---|
| Pages (from-to) | 1461-1463 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 77 |
| Issue number | 10 |
| DOIs | |
| State | Published - 2000 |
NLR Publication Number
- NREL/JA-520-28027
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