New Tool Quantitatively Maps Minority-Carrier Lifetime of Multicrystalline Silicon Bricks (Fact Sheet)

Research output: NLR › Fact Sheet

Abstract

NREL's new imaging tool could provide manufacturers with insight on their processes.

Original language	American English
Publisher	National Laboratory of the Rockies (NLR)
State	Published - 2011

@misc{84464a27ec9f441d9f3f1d2eae65b75f,

title = "New Tool Quantitatively Maps Minority-Carrier Lifetime of Multicrystalline Silicon Bricks (Fact Sheet)",

abstract = "NREL's new imaging tool could provide manufacturers with insight on their processes.",

keywords = "mc-Si, minority-carrier lifetimes, NREL Highlights, PL imaging, PV, silicon, solar",

author = "Steven Johnston",

year = "2011",

language = "American English",

publisher = "National Laboratory of the Rockies (NLR)",

address = "United States",

type = "Other",

}

TY - GEN

T1 - New Tool Quantitatively Maps Minority-Carrier Lifetime of Multicrystalline Silicon Bricks (Fact Sheet)

AU - Johnston, Steven

PY - 2011

Y1 - 2011

N2 - NREL's new imaging tool could provide manufacturers with insight on their processes.

AB - NREL's new imaging tool could provide manufacturers with insight on their processes.

KW - mc-Si

KW - minority-carrier lifetimes

KW - NREL Highlights

KW - PL imaging

KW - PV

KW - silicon

KW - solar

M3 - Fact Sheet

PB - National Laboratory of the Rockies (NLR)

ER -