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Modeling of Recombination Lifetimes in Charge-Separation Device Structures
Jamiyanaa Dashdorj
,
Richard Ahrenkiel
, Wyatt Metzger
Materials Science
National Renewable Energy Laboratory
Colorado School of Mines
Research output
:
Contribution to conference
›
Paper
›
peer-review
2
Scopus Citations
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Dive into the research topics of 'Modeling of Recombination Lifetimes in Charge-Separation Device Structures'. Together they form a unique fingerprint.
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Engineering
Device Structure
100%
Recombination Lifetime
100%
Constant Time
75%
Decay Time
75%
Gallium Arsenide
25%
Pn Junction
25%
Dopant Concentration
25%
Excess Carrier
25%
Numerical Technique
25%
Charge Injection
25%
Semiconductor Structure
25%
Separation Mechanism
25%
Minority Carriers
25%
Open Circuit Voltage
25%
Physical Phenomena
25%
Charge Carrier
25%
Diffusion
25%
Chemistry
Doping Material
100%
Diffusion
100%
Charge Carrier
100%
Gaas
100%
Physics
Time Constant
100%
Open Circuit Voltage
33%
Minority Carriers
33%
Transportation
33%
Physical Phenomena
33%
Dark Current
33%
Diffusion
33%
Earth and Planetary Sciences
Time Constant
100%
Open Circuit Voltage
33%
Dark Current
33%
Transportation
33%
Physical Phenomena
33%
Diffusivity
33%
Charge Carrier
33%