@misc{8ebccc4d42e848ea971b26c15d63f62f,
title = "Modeling Minority-Carrier Lifetime Techniques that Use Transient Excess-Carrier Decay (Poster)",
keywords = "carrier, IEEE, lifetime, modeling, NREL, photovoltaic, PV, transient",
author = "Steven Johnston",
year = "2008",
language = "American English",
series = "Presented at the 33rd IEEE Photovoltaic Specialist Conference, 11-16 May 2008, San Diego, California",
publisher = "National Laboratory of the Rockies (NLR)",
address = "United States",
type = "Other",
}