Microscopic Origins of Metastable Effects in a-Si:H and Deep Defect Characterization in a-Si,Ge:H Alloys, Annual Subcontract Report, 1 February 1991 - 31 January 1992

doi:10.2172/7233282

Microscopic Origins of Metastable Effects in a-Si:H and Deep Defect Characterization in a-Si,Ge:H Alloys, Annual Subcontract Report, 1 February 1991 - 31 January 1992

NREL

Research output: NLR › Subcontract Report

Original language	American English
Publisher	National Laboratory of the Rockies (NLR)
Number of pages	29
DOIs	https://doi.org/10.2172/7233282
State	Published - 1992

Bibliographical note

Work performed by the University of Oregon, Eugene, Oregon

NLR Publication Number

NREL/TP-451-4938

Keywords

amorphous silicon
characterization
defects
photovoltaics
solar cells

Access to Document

10.2172/7233282

Cite this

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year = "1992",

doi = "10.2172/7233282",

language = "American English",

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