Abstract
The issue of the lack of reliable correlation between the characteristics of high performance cells and their intrinsic material properties is addressed in this document. A systematic approach to the question of separating the effects of the bulk from those of the interface is described which is based on the selfconsistent analysis on a variety of both materials and solar cell properties in theannealed and degraded state. The results presented are on characteristics which include not only light I-V but also dark I-V and QE of p-i-n solar cells with different thicknesses as well as on n-i-metal Schottky barrier cell structures. These results are discussed in terms of how the contributions of the bulk i-layers can be established and quantified in the annealed as well as the degradedstates. An example is presented for such a quantitative correlation for a Schottky barrier cell structure in the annealed and degraded states.
| Original language | American English |
|---|---|
| Pages | 1125-1128 |
| Number of pages | 4 |
| State | Published - 1996 |
| Event | Twenty Fifth IEEE Photovoltaic Specialists Conference - Washington, D.C. Duration: 13 May 1996 → 17 May 1996 |
Conference
| Conference | Twenty Fifth IEEE Photovoltaic Specialists Conference |
|---|---|
| City | Washington, D.C. |
| Period | 13/05/96 → 17/05/96 |
Bibliographical note
Work performed by The Pennsylvania State University, University Park, PennsylvaniaNLR Publication Number
- NREL/CP-22511
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