| Original language | American English |
|---|---|
| Number of pages | 5 |
| Journal | Journal of Applied Physics |
| Volume | 108 |
| Issue number | 7 |
| DOIs | |
| State | Published - 2010 |
NLR Publication Number
- NREL/JA-5200-49927
Keywords
- leakage current analysis
- thin films
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