Abstract
Emerging ultrafast laser ablation and plasma focused ion beam (PFIB) scanning electron microscopy (SEM) techniques [1, 2] offer powerful capabilities for precise material analysis and modification, making it an essential tool for advancing energy technologies [3, 4]. However, understanding how materials interact with femtosecond laser irradiation and plasma-focused ion beams remains a complex challenge. This work highlights our investigation in laser-material and plasma-FIB-material interactions and how insights from this research will inform the development of adaptive control systems to enhance material processing.
| Original language | American English |
|---|---|
| Pages | 21-22 |
| Number of pages | 2 |
| DOIs | |
| State | Published - 2025 |
| Event | Microscopy and Microanalysis 2025 - Salt Lake City, UT Duration: 27 Jul 2025 → 31 Jul 2025 |
Conference
| Conference | Microscopy and Microanalysis 2025 |
|---|---|
| City | Salt Lake City, UT |
| Period | 27/07/25 → 31/07/25 |
NLR Publication Number
- NLR/CP-5K00-93251
Keywords
- automation
- cross-sectioning
- focused ion beam
- scanning electron microscopy
- ultrashort pulsed laser ablation
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