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Intrinsic and Extrinsic Loss Contributions in SrTiO3 Thin Films at Microwave Frequencies
K. F. Astafiev
, V. O. Sherman
, A. K. Tagantsev
, N. Setter
, T. Kaydanova
,
D. S. Ginley
Materials, Chemical, and Computational Science
Swiss Federal Institute of Technology Lausanne
National Renewable Energy Laboratory
Research output
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peer-review
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Engineering
Intrinsic Property
100%
Microwave Frequency
100%
Thin Films
100%
Dielectric Loss
50%
Resonance Frequency
25%
Bias Voltage
25%
Bias Field
25%
Resonance Mode
25%
Resonator
25%
Loss Tangent
25%
Extrinsic Contribution
25%
microstrip
25%
Earth and Planetary Sciences
Thin Films
100%
Microwave Frequency
100%
Dielectric Loss
50%
Single Crystal
25%
Resonator
25%
Ferroelectric Material
25%
Material Science
Thin Films
100%
Dielectric Material
50%
Film
25%
Magnesium Oxide
25%
Resonator
25%
Laser Deposition
25%
Ferroelectric Film
25%
Single Crystal
25%
Physics
Thin Films
100%
Dielectric Loss
50%
Resonator
25%
Loss Tangent
25%
Single Crystal
25%
Ferroelectric Material
25%
Laser Deposition
25%