Abstract
We report on a high-resolution transmission electron microscopy and energy-dispersive x-ray spectroscopy study of the microstructure of CdTe thin films epitaxially grown on single-crystal hexagonal CdS and cubic CdTe substrates. We find that the different structures of the substrates do not make a great structural difference on the grown CdTe films; i.e., on both substrates, the grown CdTe films have a cubic structure and high density of planar defects near the interface regions. At the CdTe/CdS interface, interdiffusion occurs, forming CdTe1-x,Sx and CdS1-xTex alloys. These alloys lead to significantly reduced mismatch at the interface.
| Original language | American English |
|---|---|
| Pages (from-to) | 5944-5948 |
| Number of pages | 5 |
| Journal | Journal of Applied Physics |
| Volume | 89 |
| Issue number | 11 I |
| DOIs | |
| State | Published - 2001 |
NLR Publication Number
- NREL/JA-520-29295
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