Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells: Paper No. 1153-A15-03

Mowafak Al-Jassim; Manuel Romero; Fude Liu; Chun Sheng Jiang; O. Kunz; J. Wong; A.G. Aberle

Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells: Paper No. 1153-A15-03

Mowafak Al-Jassim
, Manuel Romero
, Fude Liu
, Chun Sheng Jiang
, O. Kunz
, J. Wong
, A.G. Aberle

National Renewable Energy Laboratory
UNSW Australia

Research output: Contribution to conference › Paper

Original language	American English
Pages	287-292
Number of pages	6
State	Published - 2009
Event	Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium - San Francisco, California Duration: 14 Apr 2009 → 17 Apr 2009

Conference

Conference	Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium
City	San Francisco, California
Period	14/04/09 → 17/04/09

NLR Publication Number

NREL/CP-520-45593

Keywords

grain boundaries
photovoltaic
scanning probe microscopy (SPM)

Cite this

Al-Jassim, M., Romero, M., Liu, F., Jiang, C. S., Kunz, O., Wong, J., & Aberle, A. G. (2009). Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells: Paper No. 1153-A15-03. 287-292. Paper presented at Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium, San Francisco, California.

Al-Jassim, Mowafak ; Romero, Manuel ; Liu, Fude et al. / Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells : Paper No. 1153-A15-03. Paper presented at Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium, San Francisco, California.6 p.

@conference{e1ccf31344c84f4fb60df5ac5dbe642d,

title = "Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells: Paper No. 1153-A15-03",

keywords = "grain boundaries, photovoltaic, scanning probe microscopy (SPM)",

author = "Mowafak Al-Jassim and Manuel Romero and Fude Liu and Jiang, \{Chun Sheng\} and O. Kunz and J. Wong and A.G. Aberle",

year = "2009",

language = "American English",

pages = "287--292",

note = "Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium ; Conference date: 14-04-2009 Through 17-04-2009",

}

Al-Jassim, M, Romero, M, Liu, F, Jiang, CS, Kunz, O, Wong, J & Aberle, AG 2009, 'Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells: Paper No. 1153-A15-03', Paper presented at Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium, San Francisco, California, 14/04/09 - 17/04/09 pp. 287-292.

Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells: Paper No. 1153-A15-03. / Al-Jassim, Mowafak; Romero, Manuel; Liu, Fude et al.
2009. 287-292 Paper presented at Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium, San Francisco, California.

Research output: Contribution to conference › Paper

TY - CONF

T1 - Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells

T2 - Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium

AU - Al-Jassim, Mowafak

AU - Romero, Manuel

AU - Liu, Fude

AU - Jiang, Chun Sheng

AU - Kunz, O.

AU - Wong, J.

AU - Aberle, A.G.

PY - 2009

Y1 - 2009

KW - grain boundaries

KW - photovoltaic

KW - scanning probe microscopy (SPM)

M3 - Paper

SP - 287

EP - 292

Y2 - 14 April 2009 through 17 April 2009

ER -

Al-Jassim M, Romero M, Liu F, Jiang CS, Kunz O, Wong J et al.. Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells: Paper No. 1153-A15-03. 2009. Paper presented at Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium, San Francisco, California.