Abstract
Joint experimental and theoretical research program to improve processes used to eliminate or passivate lifetime-reducing defects in the Si bulk.
| Original language | American English |
|---|---|
| Publisher | National Laboratory of the Rockies (NLR) |
| Number of pages | 18 |
| State | Published - 2008 |
Bibliographical note
5/18/17: updated as part of FRC Archive project [jl]; Work performed by Texas Tech University, Lubbock, TexasNLR Publication Number
- NREL/SR-520-44376
Keywords
- carrier lifetime
- characterizations
- defects
- first-principles theory
- hydrogenation
- optimization
- passivation
- processing strategies
- PV
- silicon
Fingerprint
Dive into the research topics of 'Hydrogenation Methods and Passivation Mechanisms for c-Si Photovoltaics: Final Technical Report, 2 January 2002 - 15 January 2008'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver