@misc{d4e64371df3848cc996bdfcb9364bd3b,
title = "HelioCon Metrology and Standards",
abstract = "Presentation of Metrology highlights coming out of the HelioCon project from the past 5 years. These include ReTNA, NIO and BCS tool development, paving the way for the spin-off project for a 3r party metrology platform and standardization efforts on IEC heliostat design and test standard as well as other best practices guidelines.",
keywords = "3rd party, BCS, heliostat, metrology, NIO, ReTNA, standardization",
author = "Stephanie Meyen and Matthew Neber",
year = "2026",
doi = "10.66816/pr5385384",
language = "American English",
series = "Presented at SPIE Optics + Photonics, 23-27 August 2026, San Diego, California",
type = "Other",
}