Abstract
Presented at the 2001 NCPV Program Review Meeting: Modeled diffusion of H in 2-step Si3N4 passivation process invoking concept of storage of H. H stored during nitridation is redistributed during subsequent anneal.
| Original language | American English |
|---|---|
| Number of pages | 4 |
| State | Published - 2001 |
| Event | NCPV Program Review Meeting - Lakewood, Colorado Duration: 14 Oct 2001 → 17 Oct 2001 |
Conference
| Conference | NCPV Program Review Meeting |
|---|---|
| City | Lakewood, Colorado |
| Period | 14/10/01 → 17/10/01 |
NLR Publication Number
- NREL/CP-520-31002
Keywords
- H diffusion
- modeling
- nitridation
- passivation
- PV
- RTP
- Si3N4
Fingerprint
Dive into the research topics of 'H-Diffusion Mechanism(s) in PECVD Nitride Passivation of Si Solar Cells: Preprint'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver