Grain Boundary and Interdiffusion Studies in Compound Semiconductor Thin Films and Devices Utilizing Auger Electron Spectroscopy and Secondary Ion Mass Spectroscopy

doi:10.1016/0040-6090(79)90413-9

Grain Boundary and Interdiffusion Studies in Compound Semiconductor Thin Films and Devices Utilizing Auger Electron Spectroscopy and Secondary Ion Mass Spectroscopy

NREL

Research output: Contribution to journal › Article

Original language	American English
Pages (from-to)	99-106
Number of pages	8
Journal	Thin Solid Films
Volume	57
Issue number	1
DOIs	https://doi.org/10.1016/0040-6090(79)90413-9
State	Published - 1979

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ACNR/JA-213-3539

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10.1016/0040-6090(79)90413-9

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title = "Grain Boundary and Interdiffusion Studies in Compound Semiconductor Thin Films and Devices Utilizing Auger Electron Spectroscopy and Secondary Ion Mass Spectroscopy",

author = "NREL",

year = "1979",

doi = "10.1016/0040-6090(79)90413-9",

language = "American English",

volume = "57",

pages = "99--106",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier B.V.",

number = "1",

}

TY - JOUR

T1 - Grain Boundary and Interdiffusion Studies in Compound Semiconductor Thin Films and Devices Utilizing Auger Electron Spectroscopy and Secondary Ion Mass Spectroscopy

AU - NREL, null

PY - 1979

Y1 - 1979

UR - https://www.scopus.com/pages/publications/0018204450

U2 - 10.1016/0040-6090(79)90413-9

DO - 10.1016/0040-6090(79)90413-9

M3 - Article

SN - 0040-6090

VL - 57

SP - 99

EP - 106

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1

ER -

Grain Boundary and Interdiffusion Studies in Compound Semiconductor Thin Films and Devices Utilizing Auger Electron Spectroscopy and Secondary Ion Mass Spectroscopy

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