Abstract
This study investigates how sustained low Earth orbit (LEO) exposure affects metal halide perovskite (MHP) thin films and perovskite solar cells (PSCs). It examines samples deployed on the Materials International Space Station Experiment (MISSE) 15 and 16 missions. Five methylammonium lead iodide (MAPI) thin films are deployed on MISSE-16, each with distinct UV filters to selectively attenuate AM0 spectral bands. While post-flight optical analysis reveals that the least UV-exposed film exhibits the highest emission and lowest non-radiative recombination rate, no clear correlation is observed among the rest, and all MAPI films maintained excellent integrity throughout the mission. MISSE-15 deployed eight PSCs with diverse structures, MHP compositions, and contact materials. Post-flight analysis reveals stable, highly emissive MHPs, but damaged contacts due to ion migration, which caused loss of electrical response. The MISSE missions demonstrate MHPs' suitability for space applications, while highlighting the need for improved interfacial layers and contact materials to enhance charge carrier mobility, prevent ion migration, and improve charge carrier extraction efficiency.
| Original language | American English |
|---|---|
| Number of pages | 9 |
| Journal | Small |
| Volume | 21 |
| Issue number | 48 |
| DOIs | |
| State | Published - 2025 |
NLR Publication Number
- NLR/JA-5900-94754
Keywords
- AM0
- ion migration
- low Earth orbit
- perovskite solar cell
- recombination
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