Abstract
Cryogenic electron microscopy (cryo-EM) continues to gain prominence in materials science, particularly in battery research where it has enabled high-resolution, multimodal characterization of electrode materials and interfaces that otherwise degrade quickly under electron beam irradiation. But as anyone who has attempted cryo-EM techniques knows, freezing comes at a cost; cryo-EM experiments are time-consuming, highly sensitive, and carry an increased risk of artifacts due to issues such as frost contamination. Thus, when planning new characterization of battery materials or other beam-sensitive samples, it is critical to consider whether (and which) cryo-EM techniques are appropriate, based on study goals and an understanding of electron beam-sample interactions. Here we review such considerations for battery materials to elucidate the questions of when, why, and how to freeze to achieve high-quality characterization.
| Original language | American English |
|---|---|
| Number of pages | 14 |
| Journal | MRS Communications |
| DOIs | |
| State | Published - 2026 |
NLR Publication Number
- NLR/JA-5K00-98220
Keywords
- energy storage
- focused ion beam (FIB)
- Li
- scanning electron microscopy (SEM)
- scanning transmission electron microscopy (STEM)
- transmission electron microscopy (TEM)
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