First Working Group Meeting on the Minority Carrier Diffusion Length/Lifetime Measurement: Results of the Round Robin Lifetime/Diffusion Length Tests

doi:10.2172/150930

First Working Group Meeting on the Minority Carrier Diffusion Length/Lifetime Measurement: Results of the Round Robin Lifetime/Diffusion Length Tests

NREL

Research output: NLR › Technical Report

Abstract

At the first working group meeting on the measurement of minority carrier lifetime/diffusion length (t/L), held in Scottsdale, Dec. 1993, it was decided to have a round robin activity using selected wafers and cells. Accordingly, samples of wafers and solar cells from various vendors were collected and circulated among the participants. It took a while (two years) but, the results are finallyhere.

Original language	American English
Number of pages	70
DOIs	https://doi.org/10.2172/150930
State	Published - 1995

NLR Publication Number

NREL/TP-413-20470

Keywords

bare silicon
diffusion length
finished silicon cells
lifetime measurements
lifetime/diffusion length tests

Access to Document

10.2172/150930

Cite this

@misc{838ffc99a78c4db6952c0a544f572d35,

title = "First Working Group Meeting on the Minority Carrier Diffusion Length/Lifetime Measurement: Results of the Round Robin Lifetime/Diffusion Length Tests",

abstract = "At the first working group meeting on the measurement of minority carrier lifetime/diffusion length (t/L), held in Scottsdale, Dec. 1993, it was decided to have a round robin activity using selected wafers and cells. Accordingly, samples of wafers and solar cells from various vendors were collected and circulated among the participants. It took a while (two years) but, the results are finallyhere.",

keywords = "bare silicon, diffusion length, finished silicon cells, lifetime measurements, lifetime/diffusion length tests",

author = "NREL",

year = "1995",

doi = "10.2172/150930",

language = "American English",

type = "Other",

}

TY - GEN

T1 - First Working Group Meeting on the Minority Carrier Diffusion Length/Lifetime Measurement: Results of the Round Robin Lifetime/Diffusion Length Tests

AU - NREL, null

PY - 1995

Y1 - 1995

N2 - At the first working group meeting on the measurement of minority carrier lifetime/diffusion length (t/L), held in Scottsdale, Dec. 1993, it was decided to have a round robin activity using selected wafers and cells. Accordingly, samples of wafers and solar cells from various vendors were collected and circulated among the participants. It took a while (two years) but, the results are finallyhere.

AB - At the first working group meeting on the measurement of minority carrier lifetime/diffusion length (t/L), held in Scottsdale, Dec. 1993, it was decided to have a round robin activity using selected wafers and cells. Accordingly, samples of wafers and solar cells from various vendors were collected and circulated among the participants. It took a while (two years) but, the results are finallyhere.

KW - bare silicon

KW - diffusion length

KW - finished silicon cells

KW - lifetime measurements

KW - lifetime/diffusion length tests

U2 - 10.2172/150930

DO - 10.2172/150930

M3 - Technical Report

ER -

First Working Group Meeting on the Minority Carrier Diffusion Length/Lifetime Measurement: Results of the Round Robin Lifetime/Diffusion Length Tests

Abstract

NLR Publication Number

Keywords

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Cite this