Abstract
Polysilicon on silicon oxide (poly-Si/SiOx) passivating contacts with predominant charge-carrier transport via pinholes were prepared with room temperature metal-assisted chemical etching. Pinhole areal densities in the range of 2.8×104 to 4.5×107 cm-2 were imaged by SEM. Contact resistivity of 32 m-ohm-cm2 and implied open circuit voltage of 729 mV were obtained for symmetric n+ poly-Si/SiOx grown onto randomly textured n-Cz. We also show preliminary data pertaining boron-doped polysilicon on nitride/oxide passivating contacts, with which we achieved implied open circuit voltage above 730 mV and recombination current of 0.2 fA/cm2.
| Original language | American English |
|---|---|
| Pages | 134-136 |
| Number of pages | 3 |
| DOIs | |
| State | Published - 20 Jun 2021 |
| Event | 48th IEEE Photovoltaic Specialists Conference, PVSC 2021 - Fort Lauderdale, United States Duration: 20 Jun 2021 → 25 Jun 2021 |
Conference
| Conference | 48th IEEE Photovoltaic Specialists Conference, PVSC 2021 |
|---|---|
| Country/Territory | United States |
| City | Fort Lauderdale |
| Period | 20/06/21 → 25/06/21 |
Bibliographical note
Publisher Copyright:© 2021 IEEE.
NLR Publication Number
- NREL/CP-5900-81261
Keywords
- amorphous Si
- MACE
- mesopore
- passivating contact
- polycrystalline Si contact
Fingerprint
Dive into the research topics of 'Fabrication of Poly-Si on Locally Etched SiOx as Passivating Contacts for c-Si Solar Cells'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver