Abstract
Work to understand CdS/CdTe solar cell device physics; increase magnetron sputtering rate (while keeping high device quality); reduce thickness of CdTe layers (while keeping voltage and fill factor).
| Original language | American English |
|---|---|
| Publisher | National Laboratory of the Rockies (NLR) |
| Number of pages | 80 |
| State | Published - 2009 |
Bibliographical note
Work performed by the University of Toledo, Toledo, OhioNLR Publication Number
- NREL/SR-520-45398
Keywords
- admittance spectroscopy
- CdS
- CdTe
- deposition rate
- device physics
- device quality
- magnetron sputtering
- PV
- solar cells
- spectroscopic ellipsometry
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