Abstract
High spatial resolution scanning confocal microscopy, combined with low-temperature (5K) photoluminescence (PL) spectroscopy, can be used to probe the spatial variations in the spectral properties of photovoltaic materials with sub-micron spatial resolution. We report on the successful demonstration of this technique applied to two particular photovoltaic systems: a partially ordered GaInP 2epilayer, and a released (exposing the CdTe/CdS interface) polycrystalline CdTe film.
| Original language | American English |
|---|---|
| Number of pages | 8 |
| State | Published - 1998 |
| Event | National Center for Photovoltaics Program Review Meeting - Denver, Colorado Duration: 8 Sep 1998 → 11 Sep 1998 |
Conference
| Conference | National Center for Photovoltaics Program Review Meeting |
|---|---|
| City | Denver, Colorado |
| Period | 8/09/98 → 11/09/98 |
NLR Publication Number
- NREL/CP-590-25693
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