Evidence of the Meyer-Neldel Rule in InGaAsN Alloys and the Problem of Determining Trap Capture Cross Sections

Steven W. Johnston; Richard S. Crandall; Arthur Yelon

doi:10.1063/1.1596713

Evidence of the Meyer-Neldel Rule in InGaAsN Alloys and the Problem of Determining Trap Capture Cross Sections

Steven W. Johnston
, Richard S. Crandall
, Arthur Yelon

Materials Science

National Renewable Energy Laboratory
Polytechnique Montreal

Research output: Contribution to journal › Article › peer-review

23 Scopus Citations

Abstract

Deep hole-traps in a series of InGaAsN alloys were measured using deep-level transient spectroscopy (DLTS). A series of as-grown and annealed metalorganic chemical-vapor-deposited and molecular-beam-epitaxy samples with varying composition were also studied. A deep hole trap with activation energy ranging between 0.5 and 0.8 eV in all samples is observed.

Original language	American English
Pages (from-to)	908-910
Number of pages	3
Journal	Applied Physics Letters
Volume	83
Issue number	5
DOIs	https://doi.org/10.1063/1.1596713 https://doi.org/10.1063/1.1596713
State	Published - 2003

NLR Publication Number

NREL/JA-520-33230

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@article{4d3b3f3b1ef44e2d9f167d1538e65e97,

title = "Evidence of the Meyer-Neldel Rule in InGaAsN Alloys and the Problem of Determining Trap Capture Cross Sections",

abstract = "Deep hole-traps in a series of InGaAsN alloys were measured using deep-level transient spectroscopy (DLTS). A series of as-grown and annealed metalorganic chemical-vapor-deposited and molecular-beam-epitaxy samples with varying composition were also studied. A deep hole trap with activation energy ranging between 0.5 and 0.8 eV in all samples is observed.",

author = "Johnston, \{Steven W.\} and Crandall, \{Richard S.\} and Arthur Yelon",

year = "2003",

doi = "10.1063/1.1596713",

language = "American English",

volume = "83",

pages = "908--910",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "5",

}

TY - JOUR

T1 - Evidence of the Meyer-Neldel Rule in InGaAsN Alloys and the Problem of Determining Trap Capture Cross Sections

AU - Johnston, Steven W.

AU - Crandall, Richard S.

AU - Yelon, Arthur

PY - 2003

Y1 - 2003

N2 - Deep hole-traps in a series of InGaAsN alloys were measured using deep-level transient spectroscopy (DLTS). A series of as-grown and annealed metalorganic chemical-vapor-deposited and molecular-beam-epitaxy samples with varying composition were also studied. A deep hole trap with activation energy ranging between 0.5 and 0.8 eV in all samples is observed.

AB - Deep hole-traps in a series of InGaAsN alloys were measured using deep-level transient spectroscopy (DLTS). A series of as-grown and annealed metalorganic chemical-vapor-deposited and molecular-beam-epitaxy samples with varying composition were also studied. A deep hole trap with activation energy ranging between 0.5 and 0.8 eV in all samples is observed.

UR - https://www.scopus.com/pages/publications/0041877246

U2 - 10.1063/1.1596713

DO - 10.1063/1.1596713

M3 - Article

AN - SCOPUS:0041877246

SN - 0003-6951

VL - 83

SP - 908

EP - 910

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 5

ER -

Evidence of the Meyer-Neldel Rule in InGaAsN Alloys and the Problem of Determining Trap Capture Cross Sections

Abstract

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