Electron Microscopy Study of Individual Grain Boundaries in Cu2ZnSnSe4 Thin Films

Research output: Contribution to conference › Paper

Original language	American English
Pages	1681-1684
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.2013.6744468
State	Published - 2013
Event	2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) - Tampa, Florida Duration: 16 Jun 2013 → 21 Jun 2013

Conference	2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)
City	Tampa, Florida
Period	16/06/13 → 21/06/13

NLR Publication Number

@conference{65ba9de7c2264930905790bffed4ea64,

title = "Electron Microscopy Study of Individual Grain Boundaries in Cu2ZnSnSe4 Thin Films",

author = "Kim Jones and Andrew Norman and John Moseley and Ingrid Repins and Rommel Noufi and Zhiwei Wang",

year = "2013",

doi = "10.1109/PVSC.2013.6744468",

language = "American English",

pages = "1681--1684",

note = "2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) ; Conference date: 16-06-2013 Through 21-06-2013",

}

TY - CONF

T1 - Electron Microscopy Study of Individual Grain Boundaries in Cu2ZnSnSe4 Thin Films

AU - Jones, Kim

AU - Norman, Andrew

AU - Moseley, John

AU - Repins, Ingrid

AU - Noufi, Rommel

AU - Wang, Zhiwei

PY - 2013

Y1 - 2013

UR - https://www.scopus.com/pages/publications/84896468010

U2 - 10.1109/PVSC.2013.6744468

DO - 10.1109/PVSC.2013.6744468

M3 - Paper

SP - 1681

EP - 1684

T2 - 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)

Y2 - 16 June 2013 through 21 June 2013

ER -