Electrical Properties of Polycrystalline Semiconductor Thin Films

Lawrence Kazmerski

doi:10.2172/1832192

Electrical Properties of Polycrystalline Semiconductor Thin Films

Lawrence Kazmerski

National Renewable Energy Laboratory

Research output: NLR › Technical Report

Abstract

The understanding and subsequent control of the electrical properties of thin films have become very important due to the evolution of devices based upon these thin material layers.

Original language	American English
Number of pages	133
DOIs	https://doi.org/10.2172/1832192
State	Published - 1979

NLR Publication Number

NREL/TP-32-206

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10.2172/1832192

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title = "Electrical Properties of Polycrystalline Semiconductor Thin Films",

abstract = "The understanding and subsequent control of the electrical properties of thin films have become very important due to the evolution of devices based upon these thin material layers.",

author = "Lawrence Kazmerski",

year = "1979",

doi = "10.2172/1832192",

language = "American English",

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T1 - Electrical Properties of Polycrystalline Semiconductor Thin Films

AU - Kazmerski, Lawrence

PY - 1979

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N2 - The understanding and subsequent control of the electrical properties of thin films have become very important due to the evolution of devices based upon these thin material layers.

AB - The understanding and subsequent control of the electrical properties of thin films have become very important due to the evolution of devices based upon these thin material layers.

U2 - 10.2172/1832192

DO - 10.2172/1832192

M3 - Technical Report

ER -

Electrical Properties of Polycrystalline Semiconductor Thin Films

Abstract

NLR Publication Number

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