Abstract
Arsenic has been shown to be an effective p-type dopant of CdTe. However, challenges remain in the fabrication of high efficiency CdTe solar cells using As. As-doped CdTe is prone to self-compensation and observed accumulation of dopant atoms in CdTe near the interface with MgZnO (MZO) suggests that this could be occurring. In this study, we use SCAPS 1-D modeling software to investigate the effect of near-interface compensation. We consider three cases: shallow donors, deep recombination centers, and a thin layer of excess positive charge accumulation. All of these cases are shown to have significant effects on the current-voltage characteristics, while the thin charge layer also affects capacitance-voltage measurements.
| Original language | American English |
|---|---|
| Pages | 295-297 |
| Number of pages | 3 |
| DOIs | |
| State | Published - 2022 |
| Event | 49th IEEE Photovoltaics Specialists Conference, PVSC 2022 - Philadelphia, United States Duration: 5 Jun 2022 → 10 Jun 2022 |
Conference
| Conference | 49th IEEE Photovoltaics Specialists Conference, PVSC 2022 |
|---|---|
| Country/Territory | United States |
| City | Philadelphia |
| Period | 5/06/22 → 10/06/22 |
Bibliographical note
Publisher Copyright:© 2022 IEEE.
NLR Publication Number
- NREL/CP-5K00-81909
Keywords
- arsenic
- cadmium telluride
- CdSeTe
- compensation
- doping
- modeling
- simulation
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