Effect of Hysteresis on Measurements of Thin-Film Cell Performance: Paper No. 77730N

Research output: Contribution to conference › Paper

Original language	American English
DOIs	https://doi.org/10.1117/12.861175
State	Published - 2010
Event	SPIE Conference - San Diego, California Duration: 3 Aug 2010 → 5 Aug 2010

NLR Publication Number

@conference{91d186a59c94481ba436dc2b7f04d34f,

title = "Effect of Hysteresis on Measurements of Thin-Film Cell Performance: Paper No. 77730N",

keywords = "CdTe solar cells, degradation, DLTS, reliability, transient capacitance, transient ion drift (TID), voltage-dependent collection",

author = "David Albin and \{del Cueto\}, Joseph",

year = "2010",

doi = "10.1117/12.861175",

language = "American English",

note = "SPIE Conference ; Conference date: 03-08-2010 Through 05-08-2010",

}

TY - CONF

T1 - Effect of Hysteresis on Measurements of Thin-Film Cell Performance

T2 - SPIE Conference

AU - Albin, David

AU - del Cueto, Joseph

PY - 2010

Y1 - 2010

KW - CdTe solar cells

KW - degradation

KW - DLTS

KW - reliability

KW - transient capacitance

KW - transient ion drift (TID)

KW - voltage-dependent collection

U2 - 10.1117/12.861175

DO - 10.1117/12.861175

M3 - Paper

Y2 - 3 August 2010 through 5 August 2010

ER -