Direct Measurement of Density-of-States Effective Mass and Scattering Parameter in Transparent Conducting Oxides Using Second-Order Transport Phenomena

D. L. Young; T. J. Coutts; V. I. Kaydanov; A. S. Gilmore; W. P. Mulligan

doi:10.1116/1.1290372

Direct Measurement of Density-of-States Effective Mass and Scattering Parameter in Transparent Conducting Oxides Using Second-Order Transport Phenomena

D. L. Young
, T. J. Coutts
, V. I. Kaydanov
, A. S. Gilmore
, W. P. Mulligan

Chemistry and Nanoscience

National Renewable Energy Laboratory
Colorado School of Mines
Sunpower, Inc.

Research output: Contribution to journal › Article › peer-review

109 Scopus Citations

Abstract

The measurement of density-of-states effective mass and scattering parameters for transparent conductive oxide (TCO) thin films using second order transport phenomena was performed. The resistivity, Hall, Seebeck and Nernst coefficients were determined using Boltzmann transport equation. The density-of-states effective mass, the Fermi energy and scattering parameters of the TCO thin films were calculated from the transport coefficients.

Original language	American English
Pages (from-to)	2978-2985
Number of pages	8
Journal	Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume	18
Issue number	6
DOIs	https://doi.org/10.1116/1.1290372 https://doi.org/10.1116/1.1290372
State	Published - 2000

NLR Publication Number

NREL/JA-520-29561

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Young, D. L., Coutts, T. J., Kaydanov, V. I., Gilmore, A. S., & Mulligan, W. P. (2000). Direct Measurement of Density-of-States Effective Mass and Scattering Parameter in Transparent Conducting Oxides Using Second-Order Transport Phenomena. Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 18(6), 2978-2985. https://doi.org/10.1116/1.1290372, https://doi.org/10.1116/1.1290372

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abstract = "The measurement of density-of-states effective mass and scattering parameters for transparent conductive oxide (TCO) thin films using second order transport phenomena was performed. The resistivity, Hall, Seebeck and Nernst coefficients were determined using Boltzmann transport equation. The density-of-states effective mass, the Fermi energy and scattering parameters of the TCO thin films were calculated from the transport coefficients.",

author = "Young, \{D. L.\} and Coutts, \{T. J.\} and Kaydanov, \{V. I.\} and Gilmore, \{A. S.\} and Mulligan, \{W. P.\}",

year = "2000",

doi = "10.1116/1.1290372",

language = "American English",

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pages = "2978--2985",

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Young, DL, Coutts, TJ, Kaydanov, VI, Gilmore, AS & Mulligan, WP 2000, 'Direct Measurement of Density-of-States Effective Mass and Scattering Parameter in Transparent Conducting Oxides Using Second-Order Transport Phenomena', Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, vol. 18, no. 6, pp. 2978-2985. https://doi.org/10.1116/1.1290372, https://doi.org/10.1116/1.1290372

Direct Measurement of Density-of-States Effective Mass and Scattering Parameter in Transparent Conducting Oxides Using Second-Order Transport Phenomena. / Young, D. L.; Coutts, T. J.; Kaydanov, V. I. et al.
In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 18, No. 6, 2000, p. 2978-2985.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

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AU - Mulligan, W. P.

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AB - The measurement of density-of-states effective mass and scattering parameters for transparent conductive oxide (TCO) thin films using second order transport phenomena was performed. The resistivity, Hall, Seebeck and Nernst coefficients were determined using Boltzmann transport equation. The density-of-states effective mass, the Fermi energy and scattering parameters of the TCO thin films were calculated from the transport coefficients.

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ER -

Direct Measurement of Density-of-States Effective Mass and Scattering Parameter in Transparent Conducting Oxides Using Second-Order Transport Phenomena

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